CITCOM’S Newsroom

Technology

X-ray scan of an entire wafer with automated defect recognition and spatial resolution of 0.5 microns

Check out the specifications of our plenoptic camera in the Technology section

Sustainability

Waste reduction and manufacturing efficiency increases? These go hand in hand

Our contricution to the SETAC 2020 conference

Dissemination

Find here our flyer of the plenoptic camera

This is our flyer with general information on the CITCOM project