Technology
X-ray scan of an entire wafer with automated defect recognition and spatial resolution of 0.5 microns
Check out the specifications of our plenoptic camera in the Technology section
Sustainability
Waste reduction and manufacturing efficiency increases? These go hand in hand
Our contricution to the SETAC 2020 conference
Dissemination
Find here our flyer of the plenoptic camera
This is our flyer with general information on the CITCOM project